刊物
Precitec 3D Metrology is nominated for SPIE Prism Award
SPIE announces finalists for 2023 Prism Awards
The annual awards celebrate the best of photonics innovation in areas such as biomedical devices,…
In-Process Wafer Step Height Measurement
Non-contact and non-desctructive optical measuring in the nanonmeter range. During the grinding process the wafer thickness needs to be controlled in…
Increase productivity and reduce downtime: new flexible and robust container glass thickness measurement from ic-automation and Precitec Optical Measuring
Since 2000 ic-automation GmbH has been producing special machinery. ic-automation now offers standardized flexible wall thickness measuring systems…
